Atometrics AF Mapping Series: Example of Wafer Silicon Dioxide Film Thickness Testing

$Atometrics-3D Surface Profiler,3D Laser Profiler Sensor, Confocal Laser Displacement Sensor, Film Thickness Instrument, 3D Diffraction Profiler, lmage Dimension Measurement System，Automatic wafer inspection machine，3D automatic measurement equipment for IC substrate$

Chinese

White Light Interference
Roughness Height/height difference 3D Morphology 3D Dimensions 2D Outline 2D size Flatness Film Thickness Perspectives
lmage Dimension Measurement System
2D size
3D line laser measuring instrument
Height/height difference 3D Morphology 3D Dimensions 2D Outline 2D size Flatness
Spectral confocal displacement sensor
Height/height difference 2D Outline Flatness Thicknesses LocaliZation Oscillation/Vibration Film Thickness
Film thickness gauge FT
Film Thickness
3D Automatic Measuring Equipment
Roughness Height/height difference 3D Morphology 3D Dimensions Film Thickness
Wafer 3D automatic inspection equipment
Roughness Height/height difference 3D Morphology 3D Morphology 2D Outline 2D size
Diffraction 3D Profiler
3D Morphology Height/height difference 2D size Perspectives

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Atometrics AF Mapping Series: Example of Wafer Silicon Dioxide Film Thickness Testing

2023-12-13

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