$Atometrics-3D Surface Profiler,3D Laser Profiler Sensor, Confocal Laser Displacement Sensor, Film Thickness Instrument, 3D Diffraction Profiler, lmage Dimension Measurement System，Automatic wafer inspection machine，3D automatic measurement equipment for IC substrate$

Chinese

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White Light Interference
Roughness Height/height difference 3D Morphology 3D Dimensions 2D Outline 2D size Flatness Film Thickness Perspectives
image Dimension Measurement System
2D size
3D line laser measuring instrument
Height/height difference 3D Morphology 3D Dimensions 2D Outline 2D size Flatness
Spectral confocal displacement sensor
Height/height difference 2D Outline Flatness Thicknesses LocaliZation Oscillation/Vibration Film Thickness
Film thickness gauge FT
Film Thickness
3D Automatic Measuring Equipment
Roughness Height/height difference 3D Morphology 3D Dimensions Film Thickness
Wafer 3D automatic inspection equipment
Roughness Height/height difference 3D Morphology 3D Morphology 2D Outline 2D size
Diffraction 3D Profiler
3D Morphology Height/height difference 2D size Perspectives

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AP Altitude/Altitude Difference

Wafer Flatness
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AM Flatness

Flatness measurement of ultra-smooth lenses
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AM Roughness

0.05 nm Lens roughness
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AF Film Thickness

SiO₂
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AP Thickness

Positive and negative electrode materials and coating thickness
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AF Film Thickness

Photoresist (laser etching used in microelectronics)

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